AFM/SPM - Keysight 5500
Location: Faraday Building A69
The Keysight 5500 Atomic Force Microscope/Scanning Probe Microscope is a high performance and highly configurable top-down scanning microscope system that offers a wealth of features. The system is versatile – changing between the many possible imaging modes is facilitated by the use of modular sample plates and cantilever nose cone assemblies. The system can image in air, fluids, and under controlled environmental and temperature conditions in contact or alternating contact (acoustic & magnetic) modes.
- Force Modulation Microscopy (FMM)
- Dynamic Lateral Force Microscopy (DLFM)
- Force Spectroscopy
- Magnetic Force Microscopy (MFM)
- Electrostatic Force Microscopy (EFM)
- Kelvin Force Microscopy (KFM)
- Current Sensing AFM (CSAFM)
- Scanning Electrochemical Microscopy (SECM)
- Scanning Tunneling Microscopy (STM)